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Metal Impurities in Silicon- And Germanium-Based Technologies
Origin, Characterization, Control, and Device Impact
Cor Claeys, Eddy Simoen
305,45 €
+ 610 points
Format
Description
This book provides a unique review of various aspects of metallic contamination in Si and Ge-based semiconductors. It discusses all of the important metals including their origin during crystal and/or device manufacturing, their fundamental properties, their characterization techniques and their impact on electrical devices' performance. Several control and possible gettering approaches are addressed. The book offers a valuable reference guide for all researchers and engineers studying advanced and state-of-the-art micro- and nano-electronic semiconductor devices and circuits. Adopting an interdisciplinary approach, it combines perspectives from e.g. material science, defect engineering, device processing, defect and device characterization, and device physics and engineering.
Spécifications
Parties prenantes
- Auteur(s) :
- Editeur:
Contenu
- Nombre de pages :
- 438
- Langue:
- Anglais
- Collection :
- Tome:
- n° 270
Caractéristiques
- EAN:
- 9783030067472
- Date de parution :
- 30-01-19
- Format:
- Livre broché
- Format numérique:
- Trade paperback (VS)
- Dimensions :
- 156 mm x 234 mm
- Poids :
- 657 g
Seulement chez Librairie Club
+ 610 points sur votre carte client de Librairie Club
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